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Digital watermarking and steganography
Hardback
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- Book Synopsis
- This book intends to provide a comprehensive overview on different aspects of mechanisms and techniques for information security. It is written for students, researchers, and professionals studying in the field of multimedia security and steganography. Multimedia security and steganography is especially relevant due to the global scale of digital multimedia and the rapid growth of the Internet. Digital watermarking technology can be used to guarantee authenticity and can be applied as proof that the content has not been altered since insertion. Updated techniques and advances in watermarking are explored in this new edition. The combinational spatial and frequency domains watermarking technique provides a new concept of enlarging the embedding capacity of watermarks. The genetic algorithm (GA) based watermarking technique solves the rounding error problem and provide an efficient embedding approach. Each chapter provides the reader with a fundamental, theoretical framework, while developing the extensive advanced techniques and considering the essential principles of the digital watermarking and steganographic systems. Several robust algorithms that are presented throughout illustrate the framework and provide assistance and tools in understanding and implementing the fundamental principles.
- About The Author
- Frank Y. Shih received the B.S. degree from National Cheng-Kung University, Taiwan, in 1980, the M.S. degree from the State University of New York at Stony Brook, in 1984, and the Ph.D. degree from Purdue University, West Lafayette, Indiana, in 1987, all in Electrical and Computer Engineering. He served as departmental acting chair, associate chair, director, principal investigator, journal editor, and conference chair. Currently, he is a professor jointly appointed in the Department of Computer Science, the Department of Electrical and Computer Engineering, and the Department of Biomedical Engineering at New Jersey Institute of Technology, Newark, NJ. Dr. Shih also serves as the Director of Computer Vision Laboratory. He held a visiting professor position at Princeton University, Columbia University, National Taiwan University, National Institute of Informatics, Tokyo, and Conservatoire National Des Arts Et Metiers, Paris. Dr. Shih is a well-known scholar internationally, and he serves as the Editor-in-Chief for the Inter. Journal of Multimedia Intelligence and Security. In addition, he is on the Editorial Board of the International Journal of Pattern Recognition, the International Journal of Pattern Recognition Letters, the International Journal of Pattern Recognition and Artificial Intelligence, the International Journal of Recent Patents on Engineering, the International Journal of Recent Patents on Computer Science, the International Journal of Internet Protocol Technology, and the Journal of Internet Technology. He served as a steering member, committee member, and session chair for numerous professional conferences and workshops. Dr. Shih has received numerous grants from the National Science Foundation, Navy and Air Force, and Industry. He was the recipient of Research Initiation Award of NSF and Board of Overseers Excellence in Research Award of NJIT.Furthermore, Dr. Shih has authored three books: "Digital Watermarking and Steganography", "Image Processing and Mathematical Morphology", and "Image Processing and Pattern Recognition." He also edited one book: "Multimedia Security: Watermarking, Steganography, and Forensics." He has published 122 journal papers, 96 conference papers, and 22 book chapters. His current research interests include image processing, computer vision, watermarking and steganography, digital forensics, sensor networks, pattern recognition, bioinformatics, information security, robotics, fuzzy logic, and neural networks.
- Product Details
-
- ISBN
- 9781498738767
- Format
- Hardback
- Publisher
- CRC Press, (11 April 2017)
- Number of Pages
- 292
- Weight
- 786 grams
- Language
- English
- Dimensions
- 234 x 162 x 24 mm
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